Statistical Analysis of Spatial and Spatio-Temporal Point Patterns |
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| Author:
| Diggle, Peter J. |
| Series title: | Chapman and Hall/CRC Monographs on Statistics and Applied Probability Ser. |
| ISBN: | 978-1-032-47747-3 |
| Publication Date: | Jan 2023 |
| Publisher: | Taylor & Francis Group
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| Imprint: | CRC Press |
| Book Format: | Paperback |
| List Price: | USD $54.95 |
Book Description:
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Retaining all the material from the second edition and adding substantial new material, this third edition presents models and statistical methods for analyzing spatially referenced point process data. Reflected in the title, this edition now covers spatio-temporal point patterns. It also incorporates the use of R through several packages dedica
Retaining all the material from the second edition and adding substantial new material, this third edition presents models and statistical methods for analyzing spatially referenced point process data. Reflected in the title, this edition now covers spatio-temporal point patterns. It also incorporates the use of R through several packages dedica